You are here

IUCRC Breakthroughs

Count of results: 2
Title Center Description Date
Fixture De-embedding for High-Speed Interconnect Characterization Center for Electromagnetic Compatibility

Modern computer systems use high speed differential serial links as input/output (I/O)... more

2016
Sparse Emission Source Microscopy (ESM) Scanner with Super- Resolution Capabilities Center for Electromagnetic Compatibility

Localization and identification of electromagnetic interference (EMI) sources is a major... more

2016